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The information presented in this cross reference is based on TOSHIBA's selection criteria and should be treated as a suggestion only. Please carefully review the latest versions of all relevant information on the TOSHIBA products, including without limitation data sheets and validate all operating parameters of the TOSHIBA products to ensure that the suggested TOSHIBA products are truly compatible with your design and application.
Please note that this cross reference is based on TOSHIBA's estimate of compatibility with other manufacturers' products, based on other manufacturers' published data, at the time the data was collected.
TOSHIBA is not responsible for any incorrect or incomplete information. Information is subject to change at any time without notice.
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JTAG (Boundary Scan)
JTAG (Joint Test Action Group) is originally a name of an organization which standardizes testing for semiconductor devices and PC boards. It also means the standards themselves which have been determined by the organization.
JTAG (Boundary Scan) test checks the connections between semiconductor device pins and footprints of a PC board which the device is implemented on. Each pin of the device has a JTAG register which stores the pin data. The registers are stitched serially, and the data come out from a special pin, synchronized by a test clock. And arbitrary data can be written to the registers as well. This scheme enables to check the connectivity between the device pins and the PC board.
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Microcontrollers products incorporating a JTAG are displayed.
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