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The information presented in this cross reference is based on TOSHIBA's selection criteria and should be treated as a suggestion only. Please carefully review the latest versions of all relevant information on the TOSHIBA products, including without limitation data sheets and validate all operating parameters of the TOSHIBA products to ensure that the suggested TOSHIBA products are truly compatible with your design and application.
Please note that this cross reference is based on TOSHIBA's estimate of compatibility with other manufacturers' products, based on other manufacturers' published data, at the time the data was collected.
TOSHIBA is not responsible for any incorrect or incomplete information. Information is subject to change at any time without notice.
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ESD-pulse absorption performance for reducing 1st peak voltage
In the ESD immunity test of IEC61000-4-2 (Contact), the instantaneous voltage at which the ESD is applied is referred to as the 1st peak pulse voltage. The higher the voltage, the greater the effect on the subsequent circuits (damage or malfunction due to ESD). By installing a TVS diode (ESD protection diode), the 1st peak pulse voltage can be kept low and the ESD withstand capacity can be improved.
For Toshiba's DF2BxM5 series (EAP-V), optimized the processes are optimized and reduced the 1st peak pulse voltage is reduced by about 50% compared to with the DF2BxM4 series (EAP-IV). High ESD protection performance has been achieved with the highest class of low-1st peak pulse voltage in low-capacitance TVS diodes.
Low-1st peak pulse voltage TVS diodes
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